Measurement of volume holographic gratings

ABSTRACT

The present invention relates to methods of measuring the optical characteristics of volume holographic gratings with high resolution and with a large spectral coverage using a spectrally broad band source in conjunction with instruments that measure the spectrum such as spectrometers, imaging spectrometers, and spectrum analyzers.

CROSS-REFERENCE TO RELATED APPLICATIONS

The present patent application is a continuation and claims the priority benefit of U.S. patent application No. 12/454,279 filed May 15, 2009, which claims the priority benefit of U.S. Provisional Pat. App. No. 61/127,799 filed May 5, 2008.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to methods of measuring the optical characteristics of volume holographic gratings with a large spectral coverage.

2. Notice of Material Subject to Copyright Protection

Portions of the disclosure of this patent document contain material that is subject to copyright protection. The copyright owner has no objection to the facsimile reproduction by anyone of the patent document or the patent disclosure as it appears in the Patent and Trademark Office file or records, but otherwise reserves all copyright rights whatsoever.

3. Description of the Related Art

Characteristics of volume holographic gratings are well known. When the Bragg condition λ_(r)=2n(λ_(r))Λcos(θ_(r)), is satisfied the grating will diffract the incident beam into an output beam where λ_(r) is the readout wavelength in vacuum, n(λ_(r)) is the refractive index of the volume holographic grating element material at the readout wavelength, Λ is the grating spacing, and θ is the readout angle of incidence inside the material. The paper by H. Kogelnik (“Coupled wave theory for Thick Hologram gratings”, H. Kogelnik, The Bell System Tech. J. 48:9, 1969) provides details of volume holographic grating diffraction. For a simple uniform grating, the characteristics are completely determined by the thickness of the volume element, the refractive index modulation depth, the grating spacing, and the slant angle relative to the surface normal. For mass production of volume holographic grating elements it is desirable to measure these characteristics at the wafer level before dicing into final parts of smaller size.

U.S. Pat. No. 7,359,046 discloses methods to measure the optical characteristics of volume holographic gratings (VHG). The method relies on the concept of a collimated laser source and a volume holographic grating placed on a rotation stage. By using a fixed laser wavelength whose value is below the normal incidence Bragg wavelength of the VHG, the optical characteristics of the VHG can be determined by rotating the VHG. High spectral and spatial resolution has been shown with this method.

The inconvenience of the method disclosed is that it requires single frequency laser sources. It is difficult and very expensive to find laser sources covering a wide spectral range such as for example UV to infrared (300 nm to 4000 nm).

SUMMARY OF THE INVENTION

The invention disclosed here teaches methods and apparatus to measure the characteristics of volume holographic gratings with high spectral and spatial resolution over a wide spectral range.

BRIEF DESCRIPTION OF THE DRAWINGS

These and other features, aspects and advantages of the present invention will become better understood with regard to the following description, appended claims and accompanying drawings where:

FIG. 1: (prior art): Apparatus to measure VHG with high spectral and spatial resolution.

FIG. 2: (prior art) Spectra from Superluminescent LED (SLED), white light supercontinuum, incandescent light and various single mode lasers.

FIG. 3: Schematic of an apparatus for measuring VHG with low spatial resolution and wide spectral coverage.

FIG. 4: Schematic of an apparatus for measuring VHG with high spatial resolution and wide spectral coverage.

FIG. 5: Schematic of an apparatus for measuring VHG with a step and scan giving medium spatial resolution and wide spectral coverage.

FIG. 6: Schematic of another embodiment showing an apparatus for measuring VHG with step and scan giving medium spatial resolution and wide spectral coverage.

FIG. 7: Schematic of another embodiment apparatus for measuring VHG with high spatial resolution and wide spectral coverage.

FIG. 8: Schematic of another embodiment showing an apparatus for measuring VHG with step and scan giving medium spatial resolution, high signal to noise ratio and wide spectral coverage.

DETAILED DESCRIPTION

In the following description of the present invention, reference is made to the accompanying drawings which form a part hereof, and in which is shown by way of illustration a specific embodiment in which the invention may be practiced. It is to be understood that other embodiments may be utilized and structural changes may be made without departing from the scope of the present invention.

In a first embodiment illustrated by FIG. 1, the light from a broad-band source 300, such as but not limited to Superluminescent Light Emitting Diode (SLED), high brightness lamp, or more recently supercontinuum white light source, is coupled into a fiber 310 which can be either single mode or multimode in the spectral range of interest. The preferred embodiment is a supercontinuum white light source which has a continuous spectral coverage from approximately 400 nm to 2500 nm. The power level of the white light source is now reaching 6 W in a fiber core diameter of 3 micrometers. A collimating lens element 320 collimates the light from the said broad-band source to provide a diffraction limited collimated beam. With a multimode fiber core, the diameter of the collimated beam needs to be large enough so that the angular divergence is smaller than the acceptance angle of the VHG element 330 near normal incidence. The VHG element 330 to be tested is placed in the path of the collimated light beam. This can be done for example, but not limited to, using the facet reflection of the VHG. The angle between the incident beam and the surface of the VHG element 330 is aligned to a pre-determined value. In one embodiment, a lens element 340 captures the light after the VHG element 330 and feeds it into a high resolution spectrometer or spectrum analyzer 350. In this embodiment the spectrum analyzer 350 capture the whole beam of light which results in coarse spatial resolution.

In a variation of the previous embodiment, illustrated in FIG. 4, the light from a broadband source (e.g. supercontinuum source but not limited to) 400 is coupled into a fiber 410. The light coming out of the fiber 410 is then collimated by lens element 420 and incident of the VHG element 430. The lens element 440 and spectrometer 450 form an imaging spectrometer: at each pixel in the imaging spectrometer corresponds a spectral measurement. This method provides a high spatial resolution. The available high power from a supercontinuum source, for example, but not limited to, makes this method practical.

In another embodiment, illustrated in FIG. 5, the light from a broadband source (e.g. supercontinuum source but not limited to) 500 is coupled into a fiber 510. The light coming out of the fiber 510 is then collimated by lens element 520 and incident of the VHG element 530. The collimated beam size is made small and the VHG element 530 is spatially moved perpendicularly to the collimated beam in two dimensions so as to provide a spatial resolution of the order of the collimated beam spot size. The transmitted beam is fed into a high resolution spectrum analyzer 550 via lens element 540.

In another embodiment, illustrated in FIG. 6, the light from a broadband source (e.g. supercontinuum source but not limited to) 6.00 is coupled into a fiber 610. The light coming out of the fiber 620 is then collimated by lens element 620 and incident of the VHG element 630. The collimated beam size is large, comparable in size with the VHG element 630. An aperture 635 is placed after the VHG element 630. The aperture 635 is translated perpendicularly to the collimated beam and in two dimensions to provide a selection of the area on the VHG element 630.

The transmitted beam is fed into a high resolution spectrum analyzer 650 via lens element 640.

In yet another embodiment, illustrated in FIG. 7, the light from a broadband source (e.g. supercontinuum source but not limited to) 700 is coupled into a fiber 710. The light coming out of the fiber 720 is then collimated by lens element 720 and incident of the VHG element 730. The collimated beam size is large, comparable in size with the VHG element 730. A mechanically fixed aperture system 735 is placed after the VHG element 630. The said fixed aperture system 735 provides a non-mechanical mean of switchable apertures such as provided by a Liquid Crystal modulator. The transmitted beam is fed into a high resolution spectrum analyzer 750 via lens element 740.

In yet another embodiment, illustrated in FIG. 8, the light from a broadband source (e.g. supercontinuum source but not limited to) 800 is coupled into a fiber 810. The light coming out of the fiber 810 is then collimated by lens element 820. The collimated beam size is made small in comparison to the size of the reflective VHG element 830. A beam-splitter 825 is placed between the collimating lens 820 and the reflective VHG element 830. The VHG element is spatially moved perpendicularly to the collimated beam in two dimensions so as to provide a spatial resolution of the order of the collimated beam spot size. The antiparallel diffracted beam from the reflective VHG element 830 enters the beam splitter 825 again and a portion of it is reflected by the beam splitter 825 in to a high-resolution spectrometer 850 via the lens element 840.

In all embodiments, the lens elements, fiber tip can be placed on translation stages so that diffraction limited collimation can be achieved for a wide spectral range.

In all embodiments, the apparatus can be calibrated by taking measurements without the sample in place. This will effectively eliminate measurement errors due to non-constant source spectra and wavelength dependencies of detectors or spectrometers.

It is to be understood that the invention is not limited to only work with light from a supercontinuum source, but of any sufficiently collimated source of broad-band electro-magnetic radiation, such as microwaves or terahertz waves, and is not limited to any specific range of the electro-magnetic spectrum. The invention is not limited to any specific material that contains volume holographic gratings, but applies to any and all materials that can store amplitude, phase, or some combination of the two.

Thus, systems and methods are described in conjunction with one or more specific embodiments. The invention is defined by the claims and their full scope of equivalents. 

1. A method for measuring a volume holographic grating over a spectral range, the method comprising: generating a spectrometer image of a broadband light beam diffracted by an area of a volume holographic grating, the broadband light beam having a continuous spectral coverage range and the spectrometer image including a pixel; and determining one or more characteristics of the area of the volume holographic grating based on the pixel in the spectrometer image corresponding to a spectral measurement indicative of the one or more characteristics selected from the group consisting of diffraction efficiency, thickness, refractive index modulation depth, grating spacing, slant angle, and bulk transmission.
 2. The method of claim 1, further comprising capturing the diffracted light beam in a lens, the lens feeding the diffracted light beam into a spectrum analyzer.
 3. The method of claim 1, further comprising passing a portion of the diffracted light beam though an aperture to the spectrum analyzer, the aperture corresponding to the area of the volume holographic grating, wherein the spectrometer image is generated for the portion of the diffracted light beam.
 4. The method of claim 1, wherein generating a spectrometer image comprises moving the volume holographic grating spatially in two dimensions to provide a spatial resolution of the order of a beam size.
 5. An apparatus for measuring a volume holographic grating, the apparatus comprising: a light source for generating a broadband light beam having a continuous spectral coverage range, wherein an area of a volume holographic grating placed in a path of the light beam diffracts the light beam; a spectrum analyzer for generating a spectrometer image of the diffracted light beam, wherein a pixel in the spectrometer image corresponds to a spectral measurement indicative of one or more characteristics of the area of the volume holographic grating, the one or more characteristics selected from the group consisting of diffraction efficiency, thickness, refractive index modulation depth, grating spacing, slant angle, and bulk transmission
 6. The apparatus of claim 5, further comprising a lens for capturing the diffracted light beam and feeding the diffracted light beam into the spectrum analyzer.
 7. The apparatus of claim 5, further comprising an aperture corresponding to the area on the volume holographic grating, the aperture passing a portion of the diffracted light beam to the spectrum analyzer, wherein the spectrometer image is generated for the portion of the diffracted light beam.
 8. The apparatus of claim 5, wherein generating the spectrometer image comprises moving the volume holographic grating spatially in two dimensions to provide a spatial resolution of the order of a beam size. 